Avalanche photodiode (APD)
A photodetector with internal carrier-multiplication gain via impact ionization in a high-field region. Provides higher sensitivity than PIN at the cost of multiplication noise and bandwidth-gain tradeoff.
An avalanche photodiode separates absorption and multiplication regions. Photons are absorbed in a low-field region (similar to a PIN), and the resulting photocarriers drift into a high-field multiplication region where they trigger impact ionization, producing additional carrier pairs. The avalanche multiplication factor — typically 10 to 100 — amplifies the photocurrent before any external electronics:
where is the unity-gain responsivity (effectively the PIN responsivity at the operating wavelength).
Carrier multiplication is intrinsically noisy because each photogenerated carrier triggers a statistically variable number of secondary carriers. The excess noise factor is
where is the ratio of hole to electron ionization coefficients. Lower produces lower excess noise. Telecom InGaAs/InP APDs typically have –; silicon APDs have –.
Operating bias is just below the breakdown voltage where the field is strongest. Bias is highly temperature-sensitive — the breakdown voltage shifts by 50–200 mV/K depending on material — so APD operation requires active temperature control (see thermoelectric cooler).
Typical APD characteristics at 1550 nm:
| Parameter | Typical value |
|---|---|
| Operating bias | 25 – 70 V |
| Multiplication factor | 10 – 30 |
| Effective responsivity () | 5 – 20 A/W |
| Bandwidth | 1 – 10 GHz (lower at high ) |
| Noise-equivalent power | 0.1 – 1 pW/√Hz |
APDs outperform PINs when shot-noise from the photocurrent exceeds the thermal noise of the receiver electronics — high signal levels favor PINs (simpler, more linear), low signal levels favor APDs (gain provides advantage). For single-photon counting, single-photon avalanche diodes (SPADs) operate in Geiger mode beyond the breakdown voltage, producing a single current pulse per absorbed photon.