Photonica

Differential quantum efficiency

The dimensionless ratio of photons emitted per electron injected above threshold in a semiconductor laser. Bounded by unity for single-facet collection.

External differential quantum efficiency ηd\eta_d is defined as the ratio of incremental photons emitted to incremental electrons injected above the threshold current:

ηd  =  (PoutPout(Ith))/hν(IIth)/q  =  qλhcηs,\eta_d \;=\; \frac{(P_\text{out} - P_\text{out}(I_\text{th})) / h\nu}{(I - I_\text{th}) / q} \;=\; \frac{q \lambda}{h c} \, \eta_s,

where ηs\eta_s is the slope efficiency, qq is the electron charge, λ\lambda is the emission wavelength, hh is Planck's constant, and cc is the speed of light.

The conversion factor qλ/(hc)q \lambda / (h c) at common wavelengths:

Wavelengthqλ/(hc)q \lambda / (h c)
850 nm0.686 A/W
980 nm0.790 A/W
1064 nm0.858 A/W
1310 nm1.057 A/W
1550 nm1.250 A/W

Single-facet ηd\eta_d is bounded by the internal quantum efficiency ηi\eta_i times the mirror loss fraction; for typical uncoated symmetric Fabry–Pérot devices the front-facet ηd\eta_d ranges from 20\sim 20% to 50\sim 50%. Two-facet integrating-sphere measurements can exceed 50% and approach ηi\eta_i in low-loss devices.

Internal quantum efficiency ηi\eta_i (the fraction of injected carriers that produce stimulated photons inside the cavity, before facet escape) is extracted from inverse-length measurements over a set of devices with varying cavity lengths and is not derivable from single-device LIV.