Photonica

Relative intensity noise (RIN)

The power spectral density of relative optical power fluctuations of a laser source, normalized to the average optical power. Units are 1/Hz, conventionally expressed in dB/Hz.

Relative intensity noise (RIN) characterizes the random fluctuations of a laser's output power, normalized so that the result is independent of absolute power level:

RIN(f)  =  SδP(f)P2,\text{RIN}(f) \;=\; \frac{S_{\delta P}(f)}{\langle P \rangle^2},

where P\langle P \rangle is the average optical power and SδP(f)S_{\delta P}(f) is the one-sided power spectral density of the power fluctuation δP(t)=P(t)P\delta P(t) = P(t) - \langle P \rangle. Units are 1/Hz; values are conventionally reported in dB/Hz as 10log10(RIN)10 \log_{10}(\text{RIN}).

The RIN spectrum of a typical semiconductor laser shows characteristic frequency-dependent structure:

Frequency rangeBehavior
<100< 100 kHzElevated 1/f1/f region (carrier and current noise)
100 kHz to relaxation oscillationApproximately flat floor
At relaxation oscillation frequencyPeak (carrier-photon resonance)
Above relaxation oscillationRoll-off f4\sim f^{-4}

Typical floor RIN values:

SourceWavelengthFloor RIN
DFB telecom laser1310 / 1550 nm150-150 to 160-160 dB/Hz
Fabry–Pérot multi-mode laser1310 nm130-130 to 145-145 dB/Hz
VCSEL850 nm130-130 to 145-145 dB/Hz
Solid-state Nd:YAG1064 nm150-150 to 170-170 dB/Hz

The shot-noise limit at detected DC photocurrent IdcI_\text{dc} corresponds to a RIN floor of RINshot=2q/Idc\text{RIN}_\text{shot} = 2 q / I_\text{dc}. For Idc=1I_\text{dc} = 1 mA, this is 155-155 dB/Hz; for higher detected currents the shot-noise floor decreases. Laser RIN is bounded below by the shot-noise limit for the chosen detection power.

RIN matters for analog optical links (where it sets the SNR floor independent of received power), for coherent communication (where it contributes to phase noise via amplitude-to-phase coupling), and for any system using lasers as a precision reference. Measurement procedure is in Relative Intensity Noise Measurement of Semiconductor Lasers.