Photonica

Two-photon absorption (TPA)

A nonlinear absorption process in which two photons are simultaneously absorbed to excite an electron across a bandgap larger than either photon's individual energy. Limits high-power operation of silicon photonic devices at telecom wavelengths.

Two-photon absorption is a third-order nonlinear optical process in which a material absorbs two photons simultaneously, exciting an electron from the valence band to the conduction band. Unlike single-photon absorption (which requires photon energy Eg\geq E_g), TPA occurs at photon energies above Eg/2E_g / 2 but below EgE_g, where single-photon absorption is forbidden.

Mathematical form. The change in transmitted intensity per unit propagation length due to TPA:

dIdz  =  α1IβTPAI2,\frac{dI}{dz} \;=\; -\alpha_1 I - \beta_\text{TPA} I^2,

where α1\alpha_1 is the linear absorption coefficient and βTPA\beta_\text{TPA} is the TPA coefficient (cm/W). The TPA contribution is intensity-squared and so dominates linear absorption only at high intensities — typically megawatts per cm² or higher.

TPA coefficients at relevant wavelengths.

MaterialWavelengthβTPA\beta_\text{TPA} (cm/GW)Notes
Silicon1550 nm0.45 – 0.9Eg/2=0.56E_g / 2 = 0.56 eV; 1550 nm is 0.80 eV — strong TPA
Silicon2000 nm0.05 – 0.1Approaching Eg/2E_g/2 cutoff; TPA dropping rapidly
Silicon2200 nm~0Below Eg/2E_g/2; no TPA
Germanium1550 nm0\sim 0Below Eg/2=0.33E_g/2 = 0.33 eV
InGaAs (telecom)1550 nm1 – 5Significant TPA
GaAs1064 nm25Very strong (near EgE_g)
AlGaAs1550 nm< 0.01Far below Eg/2E_g/2; negligible
Fused silica1550 nm< 10310^{-3}Negligible

Why TPA matters for silicon photonics. Silicon photonic waveguides at 1550 nm have very small effective area (typically 0.1\sim 0.1 μm²), concentrating optical intensity to very high levels even at modest input powers. At 10\sim 10 mW of input power:

I  =  PAeff    10 mW0.1μm2  =  10 GW/cm2.I \;=\; \frac{P}{A_\text{eff}} \;\approx\; \frac{10 \text{ mW}}{0.1 \, \mu\text{m}^2} \;=\; 10 \text{ GW/cm}^2.

With βTPA=0.6\beta_\text{TPA} = 0.6 cm/GW: αTPA6\alpha_\text{TPA} \approx 6 cm1^{-1} — adding 2.6 dB/mm of effective loss. For 1-mm-long silicon devices, this represents a substantial power-handling limit.

TPA-induced free-carrier absorption (TPA + FCA). TPA generates free carriers, which then cause free-carrier absorption. The combined effect produces a power-dependent loss that scales as I2I^2 (TPA itself) plus a long-lived I3I^3 contribution (TPA-generated carriers absorbing the light over their lifetime). For silicon photonic devices, this is the dominant power-handling limit.

Mitigation strategies:

  • Operate at longer wavelengths (2200\geq 2200 nm) where silicon has no TPA — used in some Si photonic 2 μm-band research
  • Use lateral p-i-n junctions with reverse bias to sweep TPA-generated carriers out of the waveguide rapidly, reducing carrier lifetime and FCA contribution
  • Switch to Ge or III-V at high-power locations — Ge has no TPA at 1550 nm, III-V has TPA but designed for different power regimes
  • Switch to silicon nitride for high-power passive sections — SiN has bandgap of 5\sim 5 eV, so 1550 nm photons cannot do TPA

Applications of TPA (not just a nuisance):

  • Two-photon microscopy: deep-tissue fluorescence imaging using TPA-excited fluorescent probes. Avoids out-of-focus excitation because TPA requires high local intensity, providing intrinsic optical sectioning.
  • Two-photon polymerization (TPP) / 3D direct-laser-writing: photoresist hardening at the focal spot of a tightly-focused femtosecond laser, achieving sub-100 nm 3D feature size.
  • Optical limiting: protective optical elements that pass low-power light but absorb high-power destructive pulses via TPA.
  • All-optical switching: TPA-induced absorption modulation in silicon for ultrafast all-optical processing (research; not deployed).
  • Mid-IR detection: TPA-based silicon photodetectors detect mid-IR wavelengths where single-photon absorption is forbidden.

References: Bristow, Rotenberg, van Driel, Two-photon absorption and Kerr coefficients of silicon for 850 – 2200 nm, Appl. Phys. Lett. 2007 (the canonical Si TPA characterization); Reed & Knights, Silicon Photonics, Ch. 5 for the silicon-specific treatment.